Copyright © 2011, IEEEPortela García, M.García Valderas, M.San Milán, E.López Ongil, C.Entrena, LuisRodríguez, SantiagoMartín-Ortega, AlbertoMartín-Ortega, Albertode Mingo Martín, José Ramón2023-03-082023-03-082011-06-15IEEE Transactions on Nuclear Science 58(3): 1053 - 1058(2011)0018-9499https://ieeexplore.ieee.org/document/5722067http://hdl.handle.net/20.500.12666/856Complexity of current digital systems and circuits involves new challenges in the field of hardening and measuring circuit's sensitivity under SEEs. In this work, a new solution for evaluating the SEU sensitivity of space systems based on using programmable logic devices is proposed. This solution is able to perform a deep analysis of fault effects in systems with hardware functionality distribution, taking into account the high complexity of the hardware nodes (complex programmable logic devices) and their collaborative hardening properties.engAerospace applicationsCollaborative hardeningRadiation sensitivitySingle event upsetinfo:eu-repo/semantics/article10.1109/TNS.2011.21093971558-1578info:eu-repo/semantics/restrictedAccess